X-Cite® Optical Power Measurement System
The X-Cite® XR2100 and X-Cite® XP750 allow you to measure the optical power at the specimen level enabling consistent and repeatable illumination throughout research experiments, and also assist in equipment set-up and troubleshooting. With a PC interface and "Power Snapshot" tool, data can be easily stored electronically for complete experiment records.
For the ultimate in repeatability, the X-Cite® XR2100 will calibrate the X-Cite® exacte illuminator using power data from either the light guide input port or the X-Cite® XP750 at the objective plane.
- » Features & Benefits
- » XR2100 Specifications
- » XP750 Specifications
- » Testimonials
Features |
Benefits |
| X-Cite® XP750 & XR2100 |
| Microscope slide dimensions with a low profile |
Fits in a standard microscope clip for convenient measuring of light directly from the objective, without removing or reconfiguring equipment |
| Compatible with lamps, laser and LED light sources |
Economically use one system to service multiple microscopes, regardless of illumination technology |
| Large detection surface area – 10mm |
Appropriate for use with both low and high magnification objectives |
| No focusing required |
Obtain accurate measurements quickly |
| Wide range of wavelengths and power |
Suitable for use with full range of applications and microscope configurations |
| Calibration traceable to NIST* / NRC** standards |
Achieve quality assurance and confidence in accuracy of results |
| X-Cite® XR2100 |
| LCD display with backlight |
View data clearly, even in the dim lighting conditions of a microscopy imaging suite |
| Two input ports for measuring power via objective plane sensor or light guide |
Selectively monitor light source performance of entire microscope system or individual components |
| Calibration traceable to NIST* |
Achieve quality assurance and confidence in accuracy of results |
| One-button / click for data collection, storage and exporting |
Keep data organized with accurate, paperless record keeping |
| PC interface |
Manage settings and data conveniently via PC; automatable for convenience and OEM use |
| Compatibility with X-Cite® exacte calibration feature |
Easily calibrate X-Cite® exacte via light guide or objective plane sensor to display and set power in watts |
Specifications |
|
| Includes |
Handheld power meter, adapter for 3mm light guide, software CD, cables, user manual |
| Power Range |
50mW-10W |
| Measurement Resolution |
0.1mW-0.01W |
| Uncertainty*** |
±5% |
| Response Time |
1s |
| Calibration |
Traceable to NIST* |
| Wavelength Range |
340nm-675nm |
| Lamp Type / Light Source Compatibility |
X-Cite® exacte, X-Cite® 120 Series (using 3mm light guide input port) |
| Objective Compatibility |
Not applicable |
| Display |
3 digit LCD, backlight |
| Wavelength Selection |
Not Applicable |
| Data Capacity |
Store 100+ readings on handheld unit, or record directly into PC interface; export in spreadsheet compatible format |
| PC Controls |
View / change settings, download / export stored data |
| Command Protocol |
RS232 via USB virtual COM port |
| Power Supply |
2 x 3.6V Lithium Battery |
| Weight |
1lb (450g) |
| Dimensions (without cover) |
7.5" x 4.5" x 2" (19cm x 11.5cm x 5cm) |
| Worldwide Certifications |
CE marked |
| Warranty |
1 year |
| Patents |
X-Cite® Optical Power Measurement System incorporates technology protected by the following patents: US#6,437,861; US#7,335,901 |
Note: Must be used in combination with the XR2100
Specifications |
|
| Includes |
Objective plane power sensor with cable / connector for X-Cite® XR2100 |
| Power Range |
5µW-500mW |
| Measurement Resolution |
0.01µW-1mW |
| Uncertainty*** |
±6% |
| Response Time |
600ms (initial), 3s (to ensure stable reading) |
| Calibration |
Traceable to NRC** |
| Wavelength Range |
320nm-750nm |
| Lamp Type / Light Source Compatibility |
X-Cite® exacte, X-Cite® 120 Series, Mercury / HBO, Metal Halide, Xenon, LED, Laser |
| Objective Compatibility |
4X-63X; air coupled, with FOV diameters less than 10mm |
| Display |
Via X-Cite® XR2100 |
| Wavelength Selection |
1nm increments using up / down buttons on X-Cite® XR2100 or PC interface |
| Data Capacity |
Via X-Cite® XR2100 |
| PC Controls |
View / change settings, define favorite wavelengths, record data for multiple objectives / filters / intensity settings, download / export stored data |
| Command Protocol |
Via X-Cite® XR2100 |
| Power Supply |
Via X-Cite® XR2100 |
| Weight |
2.9oz (82g) |
| Dimensions (without cover) |
3" x 1" x 0.35" (75mm x 25mm x 9mm) |
| Worldwide Certifications |
Via X-Cite® XR2100 |
| Warranty |
1 year |
| Patents |
X-Cite® Optical Power Measurement System incorporates technology protected by the following patents: US#6,437,861; US#7,335,901 |
Testimonials
- "The XP750 is destined to become an important staple in the toolbox of every investigator who is doing quantitative work that demands absolute repeatability in terms of excitation output. This unit is far superior to standard power meters because it fits perfectly into a slide holder and positions the light sensor at the objective focal plane."
- Michael W. Davidson
The Florida State University
- "Much of our research depends on quantitative fluorescence microscopy analysis over long time periods. The X-Cite® XP750's design makes it easy to routinely measure the exact amount of excitation light delivered to the specimen at any given time point."
- Damir Sudar
Lawrence Berkeley National Laboratory
- "The X-Cite® XP750 is very easy to use and would be a valuable tool for any researcher wanting to measure fluorescence intensity."
- Mike Woodside
Hospital for Sick Children
*NIST – National Institute of Standards and Technology
**NRC – National Research Council
***Calibration of X-Cite® XR2100 and X-Cite® XP750 is recommended every twelve months. Contact Lumen Dynamics Group Inc. for further information.